圖片僅供參考
SN74BCT8374ANT
+物料清單IC SCAN TEST DEVICE W/FF 24-DIP
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製造商德州儀器
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製造商部分 #SN74BCT8374ANT
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有存貨6201
365 天品質保證
7*24 小時服務保證
90-日售後保障
正品保證
規格
| 屬性 | 價值 |
| Supplier | Rochester Electronics, LLC,Texas Instruments |
| Package | Tube,Tube |
| Series | 74BCT |
| ProductStatus | Obsolete |
| LogicType | Scan Test Device with D-Type Edge-Triggered Flip-Flops |
| SupplyVoltage | 4.5V ~ 5.5V |
| NumberofBits | 8 |
| OperatingTemperature | 0°C ~ 70°C |
| MountingType | Through Hole |
| Package/Case | 24-DIP (0.300, 7.62mm) |
