SN74BCT8374ADW

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SN74BCT8374ADW

+物料清單

IC SCAN TEST DEVICE W/FF 24-SOIC

365 天品質保證

7*24 小時服務保證

90-日售後保障

正品保證

規格

屬性 價值
Supplier Texas Instruments
Package / Case Tube
Series 74BCT
Part Status Active
Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
Voltage - Supply 4.5V ~ 5.5V
Number of Bits 8
Operating Temperature 0°C ~ 70°C
Mounting Type Surface Mount

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