圖片僅供參考
SN74BCT8244ADWR
+物料清單IC SCAN TEST DEVICE BUFF 24-SOIC
-
製造商德州儀器
-
製造商部分 #SN74BCT8244ADWR
-
有存貨8267
365 天品質保證
7*24 小時服務保證
90-日售後保障
正品保證
規格
| 屬性 | 價值 |
| Supplier | Texas Instruments,Rochester Electronics, LLC |
| Package | Tape & Reel (TR),Bulk |
| Series | 74BCT |
| ProductStatus | Discontinued at Digi-Key |
| LogicType | Scan Test Device with Buffers |
| SupplyVoltage | 4.5V ~ 5.5V |
| NumberofBits | 8 |
| OperatingTemperature | 0°C ~ 70°C |
| MountingType | Surface Mount |
| Package/Case | 24-SOIC (0.295, 7.50mm Width) |
