圖片僅供參考
SN74ABT18245ADLR
+物料清單IC SCAN-TEST-DEV/TXRX 56-SSOP
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製造商德州儀器
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製造商部分 #SN74ABT18245ADLR
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有存貨8720
365 天品質保證
7*24 小時服務保證
90-日售後保障
正品保證
規格
| 屬性 | 價值 |
| Supplier | Texas Instruments,Rochester Electronics, LLC |
| Package | Tape & Reel (TR),Cut Tape (CT),Bulk |
| Series | 74ABT |
| ProductStatus | Active |
| LogicType | Scan Test Device with Bus Transceivers |
| SupplyVoltage | 4.5V ~ 5.5V |
| NumberofBits | 18 |
| OperatingTemperature | -40°C ~ 85°C |
| MountingType | Surface Mount |
| Package/Case | 56-BSSOP (0.295, 7.50mm Width) |
